Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

A patent-pending indentation method gathers data on a range of materials for which it was previously unobtainable Using Nanovea’s Mechanical Tester in indentation mode, with a cylindrical flat tip, it ...